Temperature dependence of nanostructure in PbSe–ZnSe composite thin film
نویسندگان
چکیده
منابع مشابه
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This paper reports the correlation between film thickness, nanostructure and DC electrical properties of copper thin films deposited by PVD method on glass substrate. X-ray diffraction (XRD) and atomic force microscopy (AFM) were used for crystallography and morphology investigation, respectively. Resistivity was measured by four point probe instrument, while a Hall effects measurement system w...
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ژورنال
عنوان ژورنال: Journal of Physics D: Applied Physics
سال: 2014
ISSN: 0022-3727,1361-6463
DOI: 10.1088/0022-3727/47/43/435102